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Specialty Process Fabrication
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Solution
IC Design & Wafer Processing
Specialty Process Fabrication
Analysis & Testing services
Products
About Us
Contact Us
English
简体中文
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Products
Categories
Semiconductor materials
Device fabrication
Reliability and Failure Analysis Services
Testing products
Products
Visual Check: Cross-section
Visual Check: De-capsulation
Visual Check: AOI
Equipment Name :SAT (Scanning Acoustic Microscope)
Equipment Name :X-ray(CT)
Other substrate materials; glass
Epitaxial wafer
SOI wafer
SiN(Si₃N₄)
SiO2 wafer
Test Wafer
Prime Wafer
Detection and Analysis
semiconductor materials
KG Step Height Film
KG Bright Field XY Standard Film
8-inch AoI DSW
100nm CD-SEM Standard Wafer
KG-12” 3D Tin ball sheet Wafer